Abstract : the effect of the humid and hot environment on the quality life time of electronic product is discussed with emphases on the hot topic about humid heat test ? ? ? the failure mechanism of ion migration and the test method 摘要：阐述了湿热环境对电子产品质量寿命的影响，并重点介绍了目前湿热试验的热门话题：离子迁移失效的机理和试验方法。
